December 7, 2018
DDR4 memory can be quickly tested with ASSET InterTech's ScanWorks
- Without probes or bed-of-nails fixtures, ScanWorks Memory Access Verify (MAV) and Component action for DDR4's Connectivity Test (CT) can pinpoint shorts and opens on DDR4 device interconnects
- Downloadable DDR4 device models enable fast deployment of MAV test actions
- For even greater fault coverage, processor-based tests provide the added value of at-speed functional testing with structural diagnostics on DDR4 lines
Richardson, TX -- Engineers designing with Double Data Rate 4 (DDR4) memory devices can quickly deploy tests for shorts and opens on control, address and data lines with the boundary scan test (BST) tools of ASSET InterTech's ScanWorks® platform for fast test and programming. Downloadable models of DDR4 memory devices can be rapidly integrated into a ScanWorks Memory Access Verify (MAV) test action, which can then test the access to on-board DDR4 memory. With the ScanWorks MAV test action, shorts and opens testing of DDR4 memory devices can begin with board prototypes in development and continue on to production units in manufacturing.
DDR4, the latest generation of this type of fast random-access memory, doubles the top-end data transfer speed of the former generation, DDR3, and consumes less power. DDR4 devices can perform 4,266 million transfers per second (MT/s) on a 1.2 V power line. DDR3's top transfer speed is 2,133 MT/s with a 1.65 V supply.
"We are starting to see more DDR4 memory show up in designs based on system-on-a-chip (SoC) devices, such as the Zynq UltraScale+," said Michael Johnson, Product Manager for ScanWorks Boundary-Scan Test. "Our online library of DDR4 device models really simplifies the process of developing a ScanWorks MAV action for testing connectivity to these devices."
ScanWorks actually supports two means of testing DDR4 devices. The MAV action facilitates DDR4 interconnect testing by accessing the memory array through low-speed emulation of normal read and write commands. As such, this test mode can be employed without designing the circuit board to meet any specific design-for-test (DFT) considerations. In addition, ScanWorks also supports a test mode that is built into DDR4 devices, Connectivity Test (CT). When activated, CT tests for shorts and opens by defining the response of chip output pins as a combinatorial function of stimulus at input pins. As such, CT has faster test run times and offers better coverage and more granular diagnostics of faults, but implementing it presupposes that particular DFT measures had been followed when components were selected and the board was designed. When CT can be employed, ScanWorks DDR4 device models may be downloaded for use with the ScanWorks Component action.
CT and MAV are excellent means of providing fault coverage around DDR4 memory devices, however, these tests do not operate the DDR4 memory devices in their normal, at-speed functional mode. To meet this need, the ScanWorks Processor-based Functional Test tool for DDR4 (PFTDDR) provides at-speed, functional test with structural diagnostics of DDR4 memory devices. For a comprehensive test suite, PFTDDR can be run after MAV or CT tests. PFTDDR differs from all other functional test applications in that it does not require a functioning operating system in order to test the integrity and functionality of the DDR memory, saving valuable time on the production line. PFTDDR includes nine robust memory tests to exercise DDR4 at-speed and under loaded conditions.
The non-intrusive nature of ScanWorks testing is well suited to many systems with DDR4 memory devices, since they often involve densely populated circuit boards with high-speed chip-to-chip interconnects. For this type of circuit board, intrusive test technologies based on mechanical probes or bed-of-nails fixtures require physical access points, which can introduce signaling anomalies that compromise the integrity or reliability of memory function and thus invalidate certain test results. The combination of BST and PFTDDR supports robust test coverage and high test quality throughout the entire life-cycle of the product.
ScanWorks with the MAV and Component test actions capable of testing DDR4 memory device interconnects, as well as the PFTDDR configuration tools for DDR, is available now from ASSET InterTech and its distributors. For more product information, visit www.asset-intertech.com/products/boundary-scan-test or download a getting-started guide at
About ASSET InterTech
ASSET InterTech (www.asset-intertech.com) is a leading supplier of tools to debug, validate and test software and hardware. The company's SourcePoint software debug and trace platform and the ScanWorks platform for fast test and programming work in tandem to give engineers real insight from code to silicon. SourcePoint is a best-in-class, powerful debugger that includes advanced trace tools to gather data from code and quickly debug complex embedded software systems. ScanWorks includes fast test and programming tools that accelerate the development and production of circuit boards. Together, SourcePoint and ScanWorks empower engineers with tools and technology for the entire life-cycle of a system, beginning with development, through production and into field service. ASSET InterTech is located at 2201 North Central Expressway, Suite 105, Richardson, TX 75080, or call 888-694-6250.
ASSET, ScanWorks and the ScanWorks logo are registered trademarks, and SourcePoint is a trademark of ASSET InterTech, Inc. All other trade and service marks are the properties of their respective owners.
Follow us on:
You Tube: http://www.youtube.com/ASSETInterTech
Our blog - Test Data Out: http://blog.asset-intertech.com/
December 7, 2018
DDR4 memory can be quickly tested with ASSET InterTech's ScanWorks
Engineers designing with DDR4 memory can quickly test for shorts and opens on interconnects with the boundary scan test tools of ASSET InterTechs ScanWorks® platform for fast test®...
October 17, 2018
ASSET's Fast test and programming tools for Xilinx Zynq UltraScale+ systems
Faster test and programming tools from ASSET® InterTech accelerate development and production of designs based on Xilinx Zynq UltraScale+ Multiprocessor SoCs (MPSoC).
September 20, 2018
ASSET's fast test and programming tools for NXP i.MX6 designs
ASSET InterTech ScanWorks tools for fast test and programming take advantage of an agent running in on-chip memory to accelerate development and production for designs based on i.MX 6 chips from NXP.
August 13, 2018
ASSET's fast test and programming tools for Xilinx Zynq-7000 SoC systems
Fast test and programming tools from ASSET InterTech will accelerate development and production cycles for Xilinx Zynq®-7000 SoCs designs. An agent is placed in on-chip memory of an Arm core.
January 19, 2017
Circuit Check,ASSET InterTech collaborate on boundary-scan test solutions
Circuit Check (CCI) will collaborate with ASSET InterTech to more closely integrate ScanWorks boundary-scan test tools with CCI's 1000 Series Configurable ATE and CCI 6000 Series Rotary Handler.
August 17, 2016
SourcePoint debugger first with trace for Intel Skylake and other platforms
SourcePoint from ASSET InterTech is the first debugger with tools for all of the trace facilities embedded in Intel's Skylake and several other microarchitectures not yet made public.
July 14, 2016
ASSET ScanWorks for Intel speeds structural and functional test on PCBs
The newly enhanced processor-controlled test tool on ASSET InterTech's ScanWorks can perform structural, functional test and diagnostics in one pass and achieve high test speeds for manufacturing.
April 14, 2016
New SourcePoint debugger controller simplifies Intel connectivity to USB3
A new system controller for ASSET InterTech's SourcePoint software debugger allows software debug to begin immediately by offering a fast and easy way to connect to Intel ...
February 26, 2016
New eBook explains advantages of IJTAG over JTAG for embedded IP
A new eBook from ASSET InterTech explains how IEEE 1687 Internal JTAG (IJTAG) provides critical capabilities not found in older standards, such as the IEEE 1149.1 JTAG or boundary-scan standard.
December 16, 2015
Debugger offers insight into complex code execution on ARM 64-bit HeliX 2
With the greater visibility of ASSET InterTech's SourcePoint debugger engineers quickly find the root causes of bugs in complex code running on AppliedMicro's 64-bit ARM-based HeliX 2 family of SoCs.