circuitnet
Sponsor
Advanced Interconnections Corp.
Plan Ahead for BGA Device Upgrades
BGA Socket Adapter Systems convert surface mount device packages to through-hole (pinned) assemblies, making it easy to plug and unplug SMT devices in the field or the test lab.
Advanced Interconnections Corp.
Rentals and Rent to Purchase x-ray Systems
Sponsor
ECD
Maybe it's the thermocouple connection
If your thermal profiling readings seem inconsistent, the culprit could be your thermocouple attachment method. A recently conducted study revealed some interesting findings.
ECD

Materials for Advanced Ball-Attach Processes for Advanced Packages



Materials for Advanced Ball-Attach Processes for Advanced Packages
This paper will discuss advantages of advanced ball-attach materials developed to meet the challenges of advanced packaging.

DOWNLOAD
Authored By:
Evan Griffith
Indium Corporation
NY, USA

Sam Lytwynec
Indium Corporation
NY, USA

Summary

In the advanced packaging space, fan-out wafer level packaging (FOWLP) and fan-out panel level packaging (FOPLP) has become a popular packaging technology used in the semiconductor industry due to its many potential advantages (such as cost reduction) when compared to conventional flip-chip packages and other heterogeneously integrated packages. Typically, the last stage of the FOWLP manufacturing flow is the ball-attach or bumping process before package singulation. For the ball-attach process, flux is usually printed, and spheres are dropped onto the flux, then reflowed and cleaned. Due to the warpage of the reconstituted carrier, choosing a flux with appropriate properties is important for improved yields. Different aspects of flux properties will be explored in this paper.

This paper will discuss advantages of advanced ball-attach materials developed to meet the challenges of advanced packaging. First, the compatibility of these ball-attach materials with passivation materials will be discussed, with advanced materials overcoming the inherent CTE mismatch causing warpage. Next, advancements in printability of ball-attach fluxes will be discussed, with long working time being a key attribute in the assembly process. Finally, the wetting of these materials will be discussed, with a particular emphasis on consistent wetting with minimal ball movement on all areas of the package.

Conclusions

In this paper, novel ball-attach fluxes were discussed with the parameters which are important to the assembly of advanced packages. Three ball-attach fluxes were tested side-by-side with each other, with each having mostly similar results. A novel no-clean ball-attach flux was also discussed and its relevant parameters were tested. The benefits of this material as an alternative ball-attach assembly solution were highlighted. Future work will be conducted on the printability of the NC ball attach flux solution to ensure applicability is not a problem.

Initially Published in the SMTA Proceedings
Submit A Comment
Comments are reviewed prior to posting. You must include your full name to have your comments posted. We will not post your email address.

Your Name


Your Company
Your E-mail


Your Country
Your Comments



Free Newsletter Subscription
Circuitnet is built for professionals who bear the responsibility of looking ahead, imagining the future, and preparing for it.

Insert Your Email Address

Sponsor
Uyemura
RAIG Minimizes Corrosion, Allows Higher Gold on ENEPIG
Paper describes a mixed reaction RAIG electrolyte that minimizes galvanic corrosion and allows higher ENEPIG gold thicknesses, enabling robust designs and world-class quality on target with minimal variation.
Uyemura
Affordable Profiling