| Industry Paper |
IEEE 1149.6 Standard Boundary Scan Testing
As high-speed LVDS usage proliferates into high volume electronics products, millions of PCBAs will be manufactured daily, creating a dilemma for test engineers on how they can effectively conduct in-circuit test in the high volume environment. This paper discusses the challenges and available options for manufacturers to use IEEE 1149.6 standard boundary scan tests for their latest products.
Keysight Technologies
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Oxide Reduction for Reliable Electronics Manufacturing
As power densities increase and components become smaller, oxide layers and surface contamination become critical manufacturing risks. Discover practical approaches for oxide reduction, cleaning and activation in electronics production. Download the whitepaper.
Plasmatreat GmbH
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