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Copper Stud & CTE Nano Tech Underfill
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Creative-Electron

Inline Automatic X-Ray Inspection: TruViewâ„¢ Verus
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Jean-Marc Peallat


Products & Applications Mgr
Vi Technology

Jean-Marc Peallat is Products and Applications Manager for Vi Technology. He started the AOI branch of the company, ten years ago, and led successively support and application teams, notably in Americas.

Jean-Marc Peallat has submitted responses to the following questions.
"AOI" inspection using algorithm vs. image based systems
1 & 2 – The main difference between algorithm and image based AOI is the information used by the system ...
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Alltemated

Capital Expenses Significantly Reduced by Eliminating Dispensed Adhesives and Underfills
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Alltemated Inc.
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