circuitnet
Sponsor
Ormet-TLPS

AIT ORMET® TLPS for Proven Reliability
AIT ORMET® TLPS is proven for outstanding reliability for High and Ultra High-Density Interconnection and high temperature build-up Layer Interconnection beyond 175°C
Ormet® TLPS
Advanced-Interconnections
Sponsor
Aim-Solder

REL61: Cost-Effective Soldering, Elevated Performance
Many low/no-silver alternatives save money but fall short in performance. REL61 is different, offering both lower costs and better performance.
AIM Solder

Ask the Experts Member

INDEX
ASK
PANEL
JOIN
image

Bhanu Sood


Laboratory Director
CALCE, University of Maryland

Bhanu Sood is the Laboratory Director at the Center for Advanced Life Cycle Engineering (CALCE) and actively assists companies and organizations in all aspects of electronics reliability. Sood's key focus area is in design reviews, custom tests, and failure analysis services. He has authored several articles on board and component level reliability and unique failure mechanisms in electronics.

Bhanu Sood has submitted responses to the following questions.
Pre-bake in a Vacuum
Vacuum ovens will certainly reduce baking temperature to below 105 C. As prescribed in IPC-1601, a weight loss v/s time ...
Rework of Underfilled Array Packages
A few commercially available organic solvents can be used to dissolve and remove a cured underfill from under an area ...
Delamination Causing Scrap
Really, here are some broad suggestions to address your problems: (a) determine delamination caused by moisture vs. others - by ...
Puzzling PCB Reflow Delamination Problem
PCB delamination remains quite common, yet tricky, with a number of contributing root causes. Firstly, it is not clear why ...
Free Newsletter Subscription
Circuitnet is built for professionals who bear the responsibility of looking ahead, imagining the future, and preparing for it.

Insert Your Email Address

Sponsor
Creative-Electron

Inline Automatic X-Ray Inspection: TruView™ Verus
TruView™ Verus is a high-resolution inline AXI system offering advanced 2D, 2.5D, and 3D imaging to detect defects in electronic assemblies with exceptional accuracy and speed.
Creative Electron
SEHO