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| Industry Press |
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March 23, 2017
Zero Defects Int'l Introduces Three New PCBA Flying-Probe Test Services San Jose, CA: Zero Defects International [ZDI] has announced the availability of three additional services for use on printed circuit board assemblies [PCBAs]. These services complement ZDI's long offered contract PCBA testing services utilizing Seica flying-probe test systems. The first of these new services is that of test program generation for users of both Seica V8 and Pilot flying-probe testers. Companies which own either or both of these platforms can now out-source programming to ZDI. Turn-around is fast and reliable with follow up services available over 12 hours daily. Reverse engineering is the second of these newest services. Companies having a need for legacy PCBAs, built years ago and without data, can avail themselves of ZDI's expertise with the Seica flying-probe test apparatus to receive the data needed to produce a PCBA with the exact functionality of the original product. Failure analysis comprises the third of these services. Because a non-performing PCBA or, one which may have failed functional test, can often be repaired, it is necessary to know the exact failure mode ... down to the component level or within the substrate itself. Having this information enables repair but also provides valuable feedback for process improvement. Zero Defects International is a sales and service company located in Silicon Valley. PCB and PCBA test services and equipment representation, including Seica, are the key elements of the company's success. Zero Defects International More Information February 14, 2024 ZDI Announces Altest's Acquisition of Viscom 8011 Xray Inspection Equipment Zero Defects International [ZDI] has announced the acquisition by Altest Corporation of a state of the art XRay inspection system for utilization in their ... November 17, 2023 Zero Defects International to Exhibit at SMTA Silicon Valley Expo Zero Defects International [ZDI] has announced their participation as an exhibitor at the SMTA Silicon Valley Expo and Tech Forum. It will be held at Building 3 ... May 25, 2023 Zero Defects International to Exhibit at SMTA Oregon Expo & Tech Forum Zero Defects International [ZDI] has announced their participation as an exhibitor at the SMTA Oregon Expo and Tech Forum. It will be held at the Holiday Inn Portland ... April 4, 2023 Zero Defects International To Exhibit At SMTA Boise Expo Zero Defects International [ZDI] has announced their participation as an exhibitor at the SMTA Boise Expo and Tech Forum. It will be held at the Downtown Grove ... March 6, 2023 ZDI to Demonstrate TAGARNO Digital Microscopes at the SMTA Rocky Mountai TAGARNO announced that its representative, Zero Defects International (ZDI) will exhibit at the at the SMTA Rocky Mountain Expo & Tech Forum, scheduled to take place ... February 22, 2023 Zero Defects International Announces Renewal of ITAR Registration Zero Defects International has received notice of compliance with and renewed registration for ITAR, the International Traffic in Arms Regulation. The continuation ... February 15, 2023 ZDI Announces Altest's Acquisition of 10 Tagarno Digital Microscopes Zero Defects International has announced the acquisition by Altest Corporation of ten state of the art Tagarno digital microscopes for utilization in their printed ... February 8, 2023 Zero Defects International to Exhibit at Rocky Mountain Expo Zero Defects International [ZDI] has announced their participation as an exhibitor at the SMTA Rocky Mountain Expo and Tech Forum. It will be held at the Sheraton ... December 2, 2022 Zero Defects International to Exhibit at Silicon Valley Expo Zero Defects International [ZDI] has announced their participation as an exhibitor at the Silicon Valley Expo & Tech Forum. This one day event, on December 8th ... October 27, 2022 Zero Defects to Exhibit at Anaheim Electronics and Manufacturing Show Zero Defects International [ZDI] has announced their participation as an exhibitor at the new Anaheim Electronics and Manufacturing Exhibition [AEMS] to be held ... |
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