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August 10, 2012 ACD Strengthens Test Capabilities with Addition of Tenney Jr. Test Chamber RICHARDSON, TX -- ACD, a leading supplier to the electronics industry, announces a new addition to its test department -- a Tenney Jr. Model TUJR Test Chamber. In response to recent customer requests to test products at hot and cold temperatures in addition to testing at room temperature, ACD has purchased the temperature chamber to further enhance its test capabilities. With the addition of the Tenney Jr. test chamber, ACD now has the ability to test products at temperatures from -75deg to +200degC (-103deg to +392degF) with ramp rates as high as 55degC per minute. The chamber features vapor-tight, continuously welded stainless steel interiors with structural reinforcements at all critical points. With the proprietary VersaTenn controller, ACD has complete automatic chamber control with the user-friendly alphanumeric display. "The purchase of the Tenney Jr. test chamber is another step toward ACD's commitment to providing our customers with a fully tested, highly reliable product," stated W. Scott Fillebrown, ACD's President & CEO. Tenney's compact junior line of chambers in both bench-top and floor models are capable of simulating a wide range of temperature or temperature and humidity conditions. These chambers are well-suited for use in electronic, military, and pharmaceutical quality assurance and reliability testing, as well as research testing and production processes. In keeping with the needs of today’s lab, the chambers are specifically designed with a compact exterior, yet an ample interior workspace to maximize valuable floor space. For more information visit http://www.ACDUSA.com Preview the IPC Outlook listing for ACD (Automated Circuit Design) Additional News From ACD (Automated Circuit Design)
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