White Paper Download Index Detection of Faint Defects in CMOS Arrays CMOS arrays can contain over a million pixels and many different types of defects can occur in the pixel array; inspection this region is difficult. The combination of a new algorithm and a set of high-angle ring lights provides an excellent inspection solution for detection of faint defects. Rudolph Technologies Complete the form below. After you hit submit you will be redirected to the White Paper page. Please be patient, it may take a few seconds for the White Paper to load. Page views: 820 White Paper Submission Guidelines - White Paper Submit Form Semiconductor Packaging News reaches industry professionals involved in semiconductor packaging and microelectronics. If you have a technical white paper, post at no cost for readers to learn more about your technology. Our readers are interested in technical solutions. White Papers should not promote the sale of a product or service. Please limit your White Paper length to 5 pages or less. Keep the reader in mind - shorter is always better. White Papers should be submitted as PDF files less than 2 Megs.