Rosenheim: Multitest received the first multi-system order for the new InCarrier handler by a European IDM. The systems will be used for high-parallel test of small MEMS sensors.
With the InCarrier™, Multitest offers a unique test handling solution that combines the substantial advantages of the strip handling process with the advantages of the standard test handling process. Thus, it overcomes the constraints of the strip test with respect to singulation after test and lead frame design. InCarrier™ supports ASIC and MEMS test, and
offers low cost of test using high-test parallelism. The sytem also ensures a robust test handling process even for small packages. Additionally, InCarrier™ helps to fulfill special quality requirements, i.e. full device traceability, no device singulation after final test and re-test on the original equipment.
Dr. Reinhart Richter, Vice President, commented, "These recent orders are a perfect example of how Multitest works with key customers to develop new test handling concepts to lower cost of test while meeting highest quality standards."
