Circuitnet Logo
   We search for industry news, so you don't need to.
 
Home  I  News  I  Exclusives  I  Experts  I  White Papers  I  Circuitmart  I  Calendar  I  Advertising  I  Site Map




Corporate News Index

May 22, 2009

Profile Verification Survey Yields Surprising Results

Milwaukie, OR, USA – Participants in a survey begun at APEX and continued through April were asked to answer specific questions about their practices regarding thermal processing. With confidentiality promised in return for candid answers, a surprising finding emerged. While over 90% were diligent in creating a correct profile, nearly a full 60% did not display that same diligence when it came to verifying that profile on a regular basis.

When posing the question “Why?” it became clear that perceived difficulty and/or time required often dissuade otherwise vigilant manufacturers from doing so. ECD has addressed this issue on three specific levels.

First, cutting production time considerably, the V-M.O.L.E.® thermal profiler, using only three thermocouples, is an outstanding way to “verify” previously established profiles. This method, when using correct parameters, has been established as quiteeffective by a study at Binghamton University in N.Y. (study available at http://www.ecd.com/). Like its twenty-channel "sister" profiler, the MEGAM.O.L.E.®20 used for original “characterization” of the profile, the V-M.O.L.E.® provides an OK Button®. With no profiling knowledge required of the operator, it gives him/her a clear “Go/No-Go” signal, meaning the operator need not involve the engineer to "ok" a run – a true aid to maximizing production throughput, as well as assurance of quality.

The second way in which ECD encourages the profile verification of successive runs is with the newly released M.O.L.E.® AttachEzsince attachment of TCs is one of the most commonly reported barriers to consistent thermal profiling. Because so much accuracy depends on the TC itself, the method to “stick it down” should have both ease of use and minimum impact. Feedback to the M.O.L.E.® AttachEzintroduction indicates they are not only comparable to all the other popular methods for accuracy, but are proving to save both time and money, and should therefore encourage better process control and profiling protocols. Fast to attach, sticking well to flat or curved surfaces, reusable, Pb-free profiling temperature compatible, and providing number identification, they are reported to have many more uses than the ten ECD outlined at their APEX introduction. An EMS provider who is currently doing a lot of prototyping, reports after a few weeks of use that “the Attach-Ez™ work very well to hold parts that are in very close proximity to parts that are being reworked!! This has allowed us to…rework QFNs without purchasing additional specific rework nozzles at between $160 and $220 each. So far we have saved about $500.”

Third, this continued verification of the profile throughout successive runs assumes added significance in light of the newly released J-STD-075 standard. Showing degradation of thermally sensitive passive components during reflow to be one of the main causes of product field failure, it concludes that such degradation often is not picked up by traditional assembly test and inspection. Instead, it often appears years later, after the product is in the user’s hands. Thus, profiling remains the key to preventing both degradation of components andfield failure of the product...a process of trade-off management that includes art, as well as science.

As it has done since 1964, ECD will continue to seek out, address, and provide award-winning solutions for thermal process control problems as they occur. For a thorough discussion of the various methods of thermocouple attachment, please visit our BLOG at: http://www.ecd.com/blog/ and read the entry on Thermocouple Attachment.

Contact:
ECD

Grant Peterson
http://www.ecd.com


This page has been viewed 263 times.

More from ECD
August 3, 2010 - Corporate News
ECD to Showcase OvenCHECKER™ and OvenWATCH® at NEPCON Shenzhen
ECD will join WKK in Booth 2B10 and KASION at Booth 2C41 at the 2010 NEPCON show in Shenzhen. ECD will be showcasing their oven ...
ECD
June 30, 2010 - Corporate News
ECD Vice President Meets With Senators In Washington
ECD
June 1, 2010 - Corporate News
ECD Reaches 'Over 99% On-time Delivery' Status
ECD
May 5, 2010 - Corporate News
ThQM™ Program from ECD Proves Extremely Effective
ECD
March 10, 2010 - Corporate News
ECD Announces Introduction of Solar Profiling Kit
ECD
February 23, 2010 - Corporate News
ECD Adds New Training Classes To ECD-University
ECD
February 1, 2010 - Corporate News
ECD Granted Patent On Revolutionary "OK Button"
ECD announced it has received a patent on its revolutionary "OK Button," which is standard on its MEGAM.O.L.E.®20 and V-M.O.L.E.® thermal ...
ECD
December 8, 2009 - Corporate News
ECD Announces New Calibration Plan To Reduce Costs and Downtime
ECD
November 23, 2009 - Corporate News
ECD Announces Total Thermal Profiling Support Through Newly Designed Website
ECD
November 4, 2009 - Corporate News
ECD To Showcase Newest Additions to Profiling Suite at Productronica
ECD
October 2, 2009 - Corporate News
ECD-U Celebrates 1,000 Student Milestone
ECD
September 16, 2009 - Corporate News
ECD Announces Easy Oven Verification Without Use of Thermocouples
ECD
July 9, 2009 - Corporate News
ECD Introduces MAP Software V. 2.17c With Additional Thermal Profiling Benefits
ECD
May 22, 2009 - Corporate News
Profile Verification Survey Yields Surprising Results
ECD
May 4, 2009 - Corporate News
ECD Introduces Newest Version of MAP ® Software
ECD
March 26, 2009 - Corporate News
ECD To Speak On New Thermal Quality Management Program (ThQM™) at APEX
ECD
November 4, 2008 - Corporate News
ECD Introduces Newest Version of M.A.P.® Software
ECD
August 28, 2008 - Corporate News
ECD Introduces V-M.O.L.E.® Thermal Profiler At NEPCON South China
ECD
June 23, 2008 - Corporate News
ECD Appoints KIE GmbH As New Distributor In Germany and Austria
ECD
April 30, 2008 - Corporate News
ECD Adds SMT China VISION Award to Honors
ECD
March 25, 2008 - Corporate News
ECD's MEGAM.O.L.E.20 Thermal Profiler Winner of ITC Award
ECD
January 24, 2008 - Corporate News
Twenty-channel Thermal Profiler Solves Multiple Problems
ECD

To find more articles from ECD, use the search form below.




Home  |  About Us  |  Advertising  |  Advertising Rates  |  Archives  |  Ask the Experts  |  Calendar  |  Circuitmart  |  Corporate News  |  Contact Us
Free Subscription  |  Industry Forums  |  Equipment Mart  |  Exclusives  |  Letters  |  News  |  Site Map  |  Viewpoint  |  White Papers


Search Category       Search Term   
To search a phrase, place it in quotes.
We search for industry news so you don't need to.

Circuitnet LLC, 22 Parkridge Road, Haverhill, MA 01835 USA
Copyright © 2009 Circuitnet.    All rights reserved.
Jeff Ferry, Publisher  | Ken Cavallaro, Business Manager

Circuitmart - Video and audio program covering the global electronics assembly marketplace.

Semiconductor Packaging News - Semiconductor and advanced packaging news and information.