Circuitnet Logo
   We search for industry news, so you don't need to.
 
Home  I  Site Map  I  News  I  Corporate News  I  Exclusives  I  Experts  I  Equipment  I  Circuitmart  I  Calendar




Corporate News Index
April 4, 2008

KIC’s Enhanced Automatic Profiling System at NEPCON China

San DiegoKIC, the leader of thermal process development and control products, and winner of multiple industry awards, announces that the KIC Vision is now available with additional automatic capabilities - to be showcased at NEPCON China/EMT China 2008 exhibition and conference. KIC can be found in booth 2G30 of the exhibition, scheduled to take place April 8-11, 2008 in Shanghai, PR China.

The KIC Vision automatically measures a product’s thermal profile as frequently as once an hour. It eliminates the costly and error prone task associated with manual periodic profiling. While it runs in the background — without any operator involvement — to measure the product profile at a set time interval, it now can also shut down the feed conveyor when the measured profile is no longer in spec. This alarming function saves costly rework and scrap, and improves product quality.

Additionally, the new optional SPC package automatically logs basic SPC charts, including Cpk, every time a new profile is measured. This automatic feature enables basic SPC functionality at the operator level without the need for statisticians or other experts to watch over the process. This KIC Vision option will warn when the next profile’s Cpk level has dropped below the user selected level.

Both the alarming and SPC functions can trigger a light tower in order to alert the responsible technician of a problem. The data collected by the KIC Vision now can be output automatically to an external file for further data management by the user.

The new enhanced KIC Vision capabilities are designed for a higher level of automation for the electronics manufacturers’ thermal process. These tools help increase quality and productivity while offering EMS clients an improved level of process documentation and traceability.

Contact:
KIC

Allene Bailey
http://www.kicthermal.com

This page has been viewed 181 times.
We search for industry news, so you don't need to.
You would be much better informed if you could read every
important article impacting the electronics assembly and EMS
market. But you can't spend all day searching for them.


Let us do the searching for you.

Get a Free Subscription to Circuitnet

More from KIC
November 19, 2008 - Corporate News
KIC Appoints Etek Europe Ltd. as Distributor for Hungary and Romania
KIC
October 22, 2008 - Corporate News
KIC to Participate in SMART Group Temperature Profiling Workshop
KIC
October 21, 2008 - Corporate News
KIC’s MB Allen to Present Paper at European Electronics Assembly Reliability Summit, Tallinn
KIC
October 17, 2008 - Corporate News
KIC to Launch KIC Explorer Thermal Profiler In Romania at Cemconex
KIC
October 15, 2008 - Corporate News
KIC to Launch KIC Explorer Thermal Profiler at Cemconex Conference
KIC
September 15, 2008 - Corporate News
KIC to Highlight Thermal Process Yield Data Feature at IPC Midwest
KIC
September 8, 2008 - Corporate News
KIC to Highlight Advanced Products at Elektronik-08
KIC
September 4, 2008 - Corporate News
KIC Appoints Distributor for Czech Republic and Slovakia Territories
KIC
September 3, 2008 - Corporate News
Thermal Process Yield Data Coming to a PC Near You
KIC
August 22, 2008 - Corporate News
KIC Partners with GS Electronic Vertriebs und Service GmbH
KIC
August 19, 2008 - Corporate News
KIC's Enhanced Automatic Profiling System at NEPCON China
KIC
August 15, 2008 - Corporate News
KIC Debuts SunKIC
KIC
August 14, 2008 - Corporate News
KIC Announces KIC Navigator Process Set Up Tool at Nepcon China
KIC
August 11, 2008 - Corporate News
KIC to Exhibit KIC Vision at SMTAI
KIC
August 8, 2008 - Corporate News
KIC to Showcase KIC Explorer Thermal Profiler at Nepcon China
KIC
August 6, 2008 - Corporate News
KIC to Showcase the KIC Explorer Thermal Profiler at SMTAI
KIC
July 10, 2008 - Corporate News
KIC Introduces a New Profiler Model
KIC
April 22, 2008 - Corporate News
KIC's Superior Customer Service Earns the 2008 Service Excellence Award
KIC
April 21, 2008 - Corporate News
KIC's Explorer with Power Series Wins a 2008 EMAsia Innovation Award
KIC
April 16, 2008 - Corporate News
KIC’s Explorer Wins TWO 2008 SMT China Vision Awards
KIC
April 8, 2008 - Corporate News
KIC Introduces new KIC Explorer Thermal Profiler at Nepcon Shanghai
KIC
April 7, 2008 - Corporate News
KIC to Showcase 24/7 Process Monitoring at Nepcon Shanghai
KIC
April 4, 2008 - Corporate News
KIC’s Enhanced Automatic Profiling System at NEPCON China
KIC
March 27, 2008 - Corporate News
KIC to Display KIC Vision at APEX
KIC
March 25, 2008 - Corporate News
KIC to Display the KIC Explorer Thermal Profiler at APEX
KIC
To find more articles from KIC, use the search form below.





Home  |   About Us  |   Advertising  |   Advertising Rates  |   Archives  |   Ask the Experts  |   Calendar  |   Corporate News  |   Contact Us
Free Subscription  |   Industry Forums  |   Equipment Mart  |   Exclusives  |   Letters  |   Circuitmart  |   News  |   Site Map  |   Viewpoint  |   White Papers


Search Category       Search Term   
To search a phrase, place it in quotes.
We search for industry news so you don't need to.

Circuitnet LLC, 135 Ward Hill Avenue, Haverhill, MA 01835 USA
Copyright © 2008 Circuitnet.    All rights reserved.
Jeff Ferry, Publisher  | Ken Cavallaro, Business Manager

Visit Semiconductor Packaging News for the latest semiconductor and advanced packaging news and information.