Circuitnet Logo
   We search for industry news, so you don't need to.
 
Home  I  Site Map  I  News  I  Corporate News  I  Exclusives  I  Experts  I  Equipment  I  Circuitmart  I  Calendar





Ask the Experts Submit A Question  |   Index  |   Panel
May 14, 2007

Tin Whiskers

I have heard of tin whiskers creeping along the surface of a PCB under paralyene. Would vacuum impregnating potting 100% mitigate this disposable assembly?

J.O

This "Ask the Experts" page has been viewed 1009 times.

Ask the Experts Comments

May 14, 2007

I am not an expert on Tin Whiskers, but everything I have read or been told by experts is that there is no method to 100% guarantee that Tin Whiskers will not develop. There is detailed information on the iNEMI and many other web sites.

Joe Belmonte, Project Manager Adv Process Dev
Speedline Technologies
jbelmonte@speedlinetech.com

Joe BelmonteMr. Belmonte has been a process engineer and process engineering manager in the electronic manufacturing industry for over 28 years. Joe is currently a Project Manger at Speedline Technologies Advanced Process Group. Joe's primary responsibilities include managing advanced process development projects such as Lead Free Process Development, and miniature component assembly. Joe has written papers for at numerous industry trade shows and professional society meetings.

May 14, 2007

Vacuum would help but will not prevent it.

The only way to prevent whisker growth under any condition is to remove the driving force, which is the compressive stress, from the Sn coating. This can be done quite effectively by using the thin Sn (<3 um

When there is a large external applied (regardless intentional or non-intentional) compressive stress, it could induce whisker growth in the Sn layer also - it is a matter of time.

Yun Zhang, R&D Director
Cookson Electronics, Enthone

Yun ZhangMs. Zhang has a PhD in chemistry/electrochemistry. Experiences include AT&T/Lucent Bell Labs, Technic, Cookson Electronics/Enthone. Areas of expertise include: electroplating; Sn whiskers, wafer bumping, Cu post/pillar, Cu redistribution lines and Sn and SnAg bumps.

May 14, 2007

Unfortunately, your terminology is slightly confusing. Tin whiskers can penetrate paralyene. On the other hand, if the interface is weak, it may seek a more preferential path under the paralyene.

If the interface is weak, vacuum impregnation would likely have minimal effect unless it places the paralyene under stress. But, you then risk damage to your components.

Dr. Craig D. Hillman, CEO & Managing Partner
DfR Solutions
chillman@dfrsolutions.com

Dr. Craig D. HillmanDr. Hillman's specialties include best practices in Design for Reliability, strategies for transitioning to Pb-free, supplier qualification (commodity and engineered products), passive component technology and printed board failure mechanisms. Dr. Hillman has over 30 publications and has presented on a wide variety of reliability issues to over 150 companies and organizations.







Home  |   About Us  |   Advertising  |   Advertising Rates  |   Archives  |   Ask the Experts  |   Calendar  |   Corporate News  |   Contact Us
Free Subscription  |   Industry Forums  |   Equipment Mart  |   Exclusives  |   Letters  |   Circuitmart  |   News  |   Site Map  |   Viewpoint  |   White Papers


Search Category       Search Term   
To search a phrase, place it in quotes.
We search for industry news so you don't need to.

Circuitnet LLC, 135 Ward Hill Avenue, Haverhill, MA 01835 USA
Copyright © 2008 Circuitnet.    All rights reserved.
Jeff Ferry, Publisher  | Ken Cavallaro, Business Manager

Visit Semiconductor Packaging News for the latest semiconductor and advanced packaging news and information.